ExpCircuit integration test (scroll-tech#1295)

### Description

ExpCircuit integration test

### Issue Link

Closes
privacy-scaling-explorations#1100

### Type of change

- [ ] Bug fix (non-breaking change which fixes an issue)
- [x] New feature (non-breaking change which adds functionality)
- [ ] Breaking change (fix or feature that would cause existing
functionality to not work as expected)
- [ ] This change requires a documentation update

### Contents

- ExpCircuit integration test

### Rationale

For fun and profit

### How Has This Been Tested?

Running integration tests

integration-tests/src/integration_test_circuits.rs

@@ -29,6 +29,7 @@ use tokio::sync::Mutex as TokioMutex;
 use zkevm_circuits::bytecode_circuit::circuit::BytecodeCircuit;
 use zkevm_circuits::copy_circuit::CopyCircuit;
 use zkevm_circuits::evm_circuit::EvmCircuit;
+use zkevm_circuits::exp_circuit::ExpCircuit;
 use zkevm_circuits::keccak_circuit::KeccakCircuit;
 use zkevm_circuits::state_circuit::StateCircuit;
 use zkevm_circuits::super_circuit::SuperCircuit;
@@ -67,20 +68,14 @@ const CIRCUITS_PARAMS: CircuitsParams = CircuitsParams {
     max_keccak_rows: MAX_KECCAK_ROWS,
 };
 
-/// EVM Circuit degree
 const EVM_CIRCUIT_DEGREE: u32 = 18;
-/// State Circuit degree
 const STATE_CIRCUIT_DEGREE: u32 = 17;
-/// Tx Circuit degree
 const TX_CIRCUIT_DEGREE: u32 = 20;
-/// Bytecode Circuit degree
 const BYTECODE_CIRCUIT_DEGREE: u32 = 16;
-/// Copy Circuit degree
 const COPY_CIRCUIT_DEGREE: u32 = 16;
-
 const KECCAK_CIRCUIT_DEGREE: u32 = 16;
-/// Super Circuit degree
 const SUPER_CIRCUIT_DEGREE: u32 = 20;
+const EXP_CIRCUIT_DEGREE: u32 = 16;
 
 lazy_static! {
     /// Data generation.
@@ -123,6 +118,10 @@ lazy_static! {
     /// Integration test for Copy circuit
     pub static ref SUPER_CIRCUIT_TEST: TokioMutex<IntegrationTest<SuperCircuit::<Fr, MAX_TXS, MAX_CALLDATA, TEST_MOCK_RANDOMNESS>>> =
     TokioMutex::new(IntegrationTest::new("Super", SUPER_CIRCUIT_DEGREE));
+
+     /// Integration test for Exp circuit
+     pub static ref EXP_CIRCUIT_TEST: TokioMutex<IntegrationTest<ExpCircuit::<Fr>>> =
+     TokioMutex::new(IntegrationTest::new("Exp", EXP_CIRCUIT_DEGREE));
 }
 
 /// Generic implementation for integration tests

integration-tests/tests/circuits.rs

@@ -44,6 +44,11 @@ macro_rules! declare_tests {
             async fn [<serial_test_super_ $name>]() {
                 run_test! (SUPER_CIRCUIT_TEST, $block_tag, $real_prover);
             }
+
+            #[tokio::test]
+            async fn [<serial_test_exp_ $name>]() {
+                run_test! (EXP_CIRCUIT_TEST, $block_tag, $real_prover);
+            }
         }
     };
 }
@@ -58,7 +63,8 @@ macro_rules! unroll_tests {
             BYTECODE_CIRCUIT_TEST,
             COPY_CIRCUIT_TEST,
             KECCAK_CIRCUIT_TEST,
-            SUPER_CIRCUIT_TEST
+            SUPER_CIRCUIT_TEST,
+            EXP_CIRCUIT_TEST
         };
         use integration_tests::log_init;
         mod real_prover {