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sf: probe: Removed flag SECT_4K for Micron N25Q128
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Remove the flag SECT_4K for device N25Q128 as the 4K-byte
sub sector erase granularity is available only for top/
bottom 8 sectors in some of the N25Q128 chips.

Signed-off-by: Siva Durga Prasad Paladugu <[email protected]>
Signed-off-by: Michal Simek <[email protected]>
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Siva Durga Prasad Paladugu authored and Michal Simek committed Dec 11, 2013
1 parent 0494760 commit c55c35b
Showing 1 changed file with 2 additions and 4 deletions.
6 changes: 2 additions & 4 deletions drivers/mtd/spi/sf_probe.c
Original file line number Diff line number Diff line change
Expand Up @@ -99,10 +99,8 @@ static const struct spi_flash_params spi_flash_params_table[] = {
SECT_4K},
{"N25Q64", 0x20ba17, 0x0, 64 * 1024, 128, SECT_4K},
{"N25Q64A", 0x20bb17, 0x0, 64 * 1024, 128, SECT_4K},
{"N25Q128", 0x20ba18, 0x0, 64 * 1024, 256, RD_QR | WR_QPP |
SECT_4K},
{"N25Q128A", 0x20bb18, 0x0, 64 * 1024, 256, RD_QR | WR_QPP |
SECT_4K},
{"N25Q128", 0x20ba18, 0x0, 64 * 1024, 256, RD_QR | WR_QPP},
{"N25Q128A", 0x20bb18, 0x0, 64 * 1024, 256, RD_QR | WR_QPP},
{"N25Q256", 0x20ba19, 0x0, 64 * 1024, 512, RD_QR | WR_QPP |
SECT_4K},
{"N25Q256A", 0x20bb19, 0x0, 64 * 1024, 512, RD_QR | WR_QPP |
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