tests: stm32_common_devices: move to new ztest API

test cases in tests/drivers/clock_control/stm32_clock_configuration/stm32_common_devices are moved to new ztest API Signed-off-by: Meng xianglin <[email protected]>
mjaun · Sep 5, 2022 · 4e2da2e · 4e2da2e
1 parent bfd5118
commit 4e2da2e
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Showing 2 changed files with 6 additions and 21 deletions.
diff --git a/tests/drivers/clock_control/stm32_clock_configuration/stm32_common_devices/prj.conf b/tests/drivers/clock_control/stm32_clock_configuration/stm32_common_devices/prj.conf
@@ -1 +1,2 @@
 CONFIG_ZTEST=y
+CONFIG_ZTEST_NEW_API=y
diff --git a/...ntrol/stm32_clock_configuration/stm32_common_devices/src/test_stm32_clock_configuration.c b/...ntrol/stm32_clock_configuration/stm32_common_devices/src/test_stm32_clock_configuration.c
@@ -14,7 +14,7 @@ LOG_MODULE_REGISTER(test);
 #define DT_NO_CLOCK 0xFFFFU
 
 /* Not device related, but keep it to ensure core clock config is correct */
-static void test_sysclk_freq(void)
+ZTEST(stm32_common_devices_clocks, test_sysclk_freq)
 {
 	uint32_t soc_sys_clk_freq;
 
@@ -39,7 +39,7 @@ static void test_sysclk_freq(void)
 #define STM32_I2C_DOMAIN_CLOCK_SUPPORT 0
 #endif
 
-static void test_i2c_clk_config(void)
+ZTEST(stm32_common_devices_clocks, test_i2c_clk_config)
 {
 	static const struct stm32_pclken pclken[] = STM32_DT_CLOCKS(DT_NODELABEL(i2c1));
 
@@ -119,8 +119,6 @@ static void test_i2c_clk_config(void)
 	/* Test clock_off(srce) */
 	/* Not supported today */
 }
-#else
-static void test_i2c_clk_config(void) {}
 #endif
 
 #if DT_NODE_HAS_STATUS(DT_NODELABEL(lptim1), okay)
@@ -134,7 +132,7 @@ static void test_i2c_clk_config(void) {}
 #define STM32_LPTIM_OPT_CLOCK_SUPPORT 0
 #endif
 
-static void test_lptim_clk_config(void)
+ZTEST(stm32_common_devices_clocks, test_lptim_clk_config)
 {
 	static const struct stm32_pclken pclken[] = STM32_DT_CLOCKS(DT_NODELABEL(lptim1));
 
@@ -214,8 +212,6 @@ static void test_lptim_clk_config(void)
 	/* Test clock_off(domain clk) */
 	/* Not supported today */
 }
-#else
-static void test_lptim_clk_config(void) {}
 #endif
 
 #if DT_NODE_HAS_STATUS(DT_NODELABEL(adc1), okay)
@@ -255,7 +251,7 @@ static void test_lptim_clk_config(void) {}
 #define ADC_SOURCE_PLL		(-1)
 #endif
 
-static void test_adc_clk_config(void)
+ZTEST(stm32_common_devices_clocks, test_adc_clk_config)
 {
 	static const struct stm32_pclken pclken[] = STM32_DT_CLOCKS(DT_NODELABEL(adc1));
 
@@ -326,17 +322,5 @@ static void test_adc_clk_config(void)
 	/* Test clock_off(domain clk) */
 	/* Not supported today */
 }
-#else
-static void test_adc_clk_config(void) {}
 #endif
-
-void test_main(void)
-{
-	ztest_test_suite(test_stm32_common_devices_clocks,
-		ztest_unit_test(test_sysclk_freq),
-		ztest_unit_test(test_i2c_clk_config),
-		ztest_unit_test(test_lptim_clk_config),
-		ztest_unit_test(test_adc_clk_config)
-			 );
-	ztest_run_test_suite(test_stm32_common_devices_clocks);
-}
+ZTEST_SUITE(stm32_common_devices_clocks, NULL, NULL, NULL, NULL, NULL);