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mtd: nand: scan 1st and 2nd page for Macronix SLC
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Signed-off-by: Brian Norris <[email protected]>
Signed-off-by: Artem Bityutskiy <[email protected]>
Signed-off-by: David Woodhouse <[email protected]>
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computersforpeace authored and David Woodhouse committed Jan 9, 2012
1 parent c01804e commit 8c34233
Showing 1 changed file with 4 additions and 3 deletions.
7 changes: 4 additions & 3 deletions drivers/mtd/nand/nand_base.c
Original file line number Diff line number Diff line change
Expand Up @@ -3132,8 +3132,8 @@ static struct nand_flash_dev *nand_get_flash_type(struct mtd_info *mtd,
* Bad block marker is stored in the last page of each block
* on Samsung and Hynix MLC devices; stored in first two pages
* of each block on Micron devices with 2KiB pages and on
* SLC Samsung, Hynix, Toshiba and AMD/Spansion. All others scan
* only the first page.
* SLC Samsung, Hynix, Toshiba, AMD/Spansion, and Macronix.
* All others scan only the first page.
*/
if ((chip->cellinfo & NAND_CI_CELLTYPE_MSK) &&
(*maf_id == NAND_MFR_SAMSUNG ||
Expand All @@ -3143,7 +3143,8 @@ static struct nand_flash_dev *nand_get_flash_type(struct mtd_info *mtd,
(*maf_id == NAND_MFR_SAMSUNG ||
*maf_id == NAND_MFR_HYNIX ||
*maf_id == NAND_MFR_TOSHIBA ||
*maf_id == NAND_MFR_AMD)) ||
*maf_id == NAND_MFR_AMD ||
*maf_id == NAND_MFR_MACRONIX)) ||
(mtd->writesize == 2048 &&
*maf_id == NAND_MFR_MICRON))
chip->bbt_options |= NAND_BBT_SCAN2NDPAGE;
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